Published:Journal of Chromatographic Science,
ISSN 0021-9665 Volume 45,
Number 5, May/June 2007, pp.263-268
Thin-Layer Chromatography of Aluminium: Quantitative
Densitometric Determination of Fe2+, Ni2+, Cu2+, and Si4+
P.A. Mohamed Najar, R.N. Chouhan, J.U. Jeurkar,
S.D. Dolas, and K.V. Ramana Rao
Jawaharlal Nehru Aluminium Research Development and Design Centre,
Amaravati Road, Nagpur, India—440 023
Thin-layer chromatography in combination with scanning
densitometry is used as a tool for the quantitative determination
of some impurity and additive elements in aluminium. Microgram
levels of iron, silicon, copper, nickel, titanium, magnesium,
manganese, and zinc present in a high concentration aluminium
matrix is detected, and selective separations of some of these
elements are achieved on silica gel H layers developed with a
mobile phase containing aqueous sodium chloride solution. The
quantitative determination of iron, silicon, nickel, and copper
are obtained from the densitometric evaluation of chromatograms
and are compared with the respective optical emission spectral
analytical data.
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